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nanodeviceflakedetectalign

Register source microscope images to the full_stack coordinate system using SIFT (same-substrate) or Chamfer+DE (cross-substrate) alignment. Use when aligning bottom_part, top_part, or other source images to the full_stack reference image for van der Waals stack detection.

caidish
maintainer
caidish
Обновлено 3/24/2026
Звёзды
11
Форки
2
quick start

Installation and usage

Register source microscope images to the full_stack coordinate system using SIFT (same-substrate) or Chamfer+DE (cross-substrate) alignment. Use when aligning bottom_part, top_part, or other source images to the full_stack reference image for van der Waals stack detection.

Установка
$ install --globalskills.sh
Использование

После установки вы можете использовать этот skill, выполнив следующую команду в терминале:

skills use nanodeviceflakedetectalign