astronomy-physicsresearch
nanodeviceflakedetectalign
Register source microscope images to the full_stack coordinate system using SIFT (same-substrate) or Chamfer+DE (cross-substrate) alignment. Use when aligning bottom_part, top_part, or other source images to the full_stack reference image for van der Waals stack detection.
maintainer
caidish
更新于 3/24/2026
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quick start
Installation and usage
Register source microscope images to the full_stack coordinate system using SIFT (same-substrate) or Chamfer+DE (cross-substrate) alignment. Use when aligning bottom_part, top_part, or other source images to the full_stack reference image for van der Waals stack detection.
安装
$ install --globalskills.sh
使用
安装后，您可以通过在终端运行以下命令来使用此技能：
skills use nanodeviceflakedetectalign